FT-IR model: HYPERION

• Selection of detectors for µ-FT-IR: Broad-, mid, narrow-band LN₂-MCTs,thermoelectrically cooled (TE) MCT.
• Focal-plane array detector for infrared imaging (64 x 64 or 128 x 128 pixel).
• Optional QCL implementation by Laser Infrared Imaging Module (ILIM, laser class 1)
• Objective lens selection: 3.5x/15x/36x IR, 20x ATR, 15x GIR, 4x/40x VIS.
• Spectral range extension – from Near-Infrared (NIR) to Far-Infrared (FIR)Selection of apertures: manual knife-edge, automated knife-edge aperture wheel. Metal apertures for NIR
• Selection of accessories and sample stages: macro IR imaging accessory, cooling/heating stage, sample compartment, etc.
• Selection of visual/optical tools: Darkfield illumination, Fluorescence illumination, VIS polarizers, IR polarizers, etc.

• Perfect match of spectral and visual images. Applies to any measurement mode (including ATR imaging).
• Diffraction limited high sensitivity FT-IR microscopy and imaging by using focal plane array (FPA) detector
• First ever combination of FT-IR and QCL technology by (optional) Infrared Laser Imaging Module (ILIM, laser class 1).
• Infrared laser imaging in all measurement modes (ATR, Transmission, Reflectance).
• Patented coherence reduction for artifact free Laser Imaging measurements without sensitivity or speed loss.
• High imaging speeds: 0.1 mm²per second (FPA, full spectrum) 6.4 mm² per second (ILIM, single wavenumber)
• Optional TE-MCT detector to perform IR microscopy with high spatial resolution and sensitivity without liquid Nitrogen.
• Emission spectroscopy capability and optional spectral range extensions.

• Life science | cell imaging
• Pharmaceuticals
• Emissivity studies (e.g. LEDs)
• Failure and Root Cause Analysis
• Forensics
• Microplastics
• Industrial R&D
• Polymers & Plastics
• Surface characterization
• Semiconductor

credit: https://www.bruker.com/en/products-and-solutions/infrared-and-raman/ft-ir-microscopes/hyperion-ii-ft-ir-and-qcl-microscope.html